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[IEEE 11th IEEE International Software Metrics Symposium (METRICS'05) - Como, Italy (19-22 Sept. 2005)] 11th IEEE International Software Metrics Symposium (METRICS'05) - Validation of New Theses on Off-the-Shelf Component Based Development
Jingyue Li,, Conradi, R., Slyngstad, O.P.N., Bunse, C., Khan, U., Torchiano, M., Morisio, M.Year:
2005
Language:
english
DOI:
10.1109/metrics.2005.53
File:
PDF, 404 KB
english, 2005