Transmission electron microscopy on interface engineered...

IEEE Transactions on Appiled Superconductivity 2003 / 06 Vol. 13; Iss. 2

Transmission electron microscopy on interface engineered superconducting thin films

Bals, S., Van Tendeloo, G., Rijnders, G., Huijben, M., Leca, V., Blank, D.H.A.
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.812023
Date:
June, 2003
File:
PDF, 785 KB
english, 2003
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