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[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Performance analysis of CNFET based circuits in the presence of fabrication imperfections
Chrzanowska-Jeske, Malgorzata, Ashraf, Rehman, Nain, Rajeev K., Narendra, Siva G.Year:
2012
Language:
english
DOI:
10.1109/iscas.2012.6271495
File:
PDF, 537 KB
english, 2012