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[IEEE 20th Biennial Conference on Precision Electromagnetic Measurements - Braunschweig, Germany (17-21 June 1996)] Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements - New structure for a six-port reflectometer in MMIC technology
Wiedmann, F., Huyart, B., Bergeault, E., Jallet, L.Year:
1996
Language:
english
DOI:
10.1109/cpem.1996.547335
File:
PDF, 206 KB
english, 1996