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Cavity origin and influence on reliability in lead zirconate titanate thin film capacitors
Chentir, Mohamed-Tahar, Ventura, Laurent, Bouyssou, Émilien, Anceau, ChristineVolume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3212985
File:
PDF, 591 KB
english, 2009