Electron Probe Microanalysis of Thin Films and Multilayers...

Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

Llovet, X, Merlet, C
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609094215
Date:
July, 2009
File:
PDF, 172 KB
english, 2009
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