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Electronic structure and contact resistance at an open-end...

Electronic structure and contact resistance at an open-end carbon nanotube and copper interface

Gao, Feng, Qu, Jianmin, Yao, Matthew
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Volume:
96
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3354077
File:
PDF, 754 KB
english, 2010
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