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Deep defects in GaN/AlGaN/SiC heterostructures
Kindl, D., Hubík, P., Krištofik, J., Mareš, J. J., Výborný, Z., Leys, M. R., Boeykens, S.Volume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3122290
File:
PDF, 926 KB
english, 2009