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[IEEE 30th European Microwave Conference, 2000 - Paris, France (2000.10.4-2000.10.6)] 30th European Microwave Conference, 2000 - An Efficient Monte Carlo Based Ray Tracing Technique for the Characterization of Highly Multimode Dielectric Waveguides with Rough Surfaces
Bierhoff, Th., Griese, E., Mrozynski, G.Year:
2000
Language:
english
DOI:
10.1109/euma.2000.338739
File:
PDF, 4.47 MB
english, 2000