![](/img/cover-not-exists.png)
Optical Measurement of Crop Cover for Yield Prediction of Wheat
M. Reyniers, E. Vrindts, J. De BaerdemaekerVolume:
89
Year:
2004
Language:
english
Pages:
12
DOI:
10.1016/j.biosystemseng.2004.09.003
File:
PDF, 698 KB
english, 2004