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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Predicting Scan Compression IP Configurations for Better QoR
Saikia, Jyotirmoy, Notiyath, Pramod, Kulkarni, Santosh, Anbalan, Ashok, Uppuluri, Rajesh, Fernandes, Tammy, Bhattacharya, Parthajit, Kapur, RohitYear:
2011
Language:
english
DOI:
10.1109/ats.2011.30
File:
PDF, 564 KB
english, 2011