[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Test Patterns for Verilog Design Error Localization
Peischl, Bernhard, Riaz, Naveed, Wotawa, FranzYear:
2009
Language:
english
DOI:
10.1109/taicpart.2009.37
File:
PDF, 318 KB
english, 2009