Observing Electroluminescence from Yellow Luminescence-Like...

Japanese Journal of Applied Physics 2008 / 5 Vol. 47; Iss. 5

Observing Electroluminescence from Yellow Luminescence-Like Defects in GaN High Electron Mobility Transistors

Chen, Hsiang, Lai, Zhian, Kung, Sheng-Chin, Penner, Reginald M., Chou, Yeong-Chang, Lai, Richard, Wojtowicz, Mike, Li, Guann-Pyng
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Volume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.3336
Date:
May, 2008
File:
PDF, 200 KB
english, 2008
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