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[IEEE 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - Jilin, China (2011.08.19-2011.08.22)] 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - Rotation and scaling invariant feature lines for image matching
Ye, Zhang, Yanjie, Wang, Changchun, Qu HongsongYear:
2011
Language:
english
DOI:
10.1109/mec.2011.6025667
File:
PDF, 788 KB
english, 2011