Inelastic electron tunneling spectrometer to characterize...

Inelastic electron tunneling spectrometer to characterize metal–oxide–semiconductor devices with ultrathin oxides

Petit, C., Salace, G.
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Volume:
74
Year:
2003
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1611995
File:
PDF, 539 KB
english, 2003
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