Comprehensive Rutherford backscattering and channeling study of ion‐beam‐synthesized ErSi1.7 layers
Wu, M. F., Vantomme, A., De Wachter, J., Degroote, S., Pattyn, H., Langouche, G., Bender, H.Volume:
79
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.361516
Date:
May, 1996
File:
PDF, 4.17 MB
english, 1996