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[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces
Erickson, Nicholas, Fan, Jun, Gao, Xu, Achkir, Brice, Pan, SimingYear:
2014
Language:
english
DOI:
10.1109/ISEMC.2014.6899052
File:
PDF, 1.08 MB
english, 2014