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[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Double frequency test for detecting faults in induction machines
Jornet, A., Cusido, J., Espinosa, A.G., Ortega, J.A., Romeral, L.Year:
2005
Language:
english
DOI:
10.1109/iecon.2005.1569129
File:
PDF, 532 KB
english, 2005