A high-vacuum deposition system for in situ and real-time electrical characterization of organic thin-film transistors
Quiroga, Santiago David, Shehu, Arian, Albonetti, Cristiano, Murgia, Mauro, Stoliar, Pablo, Borgatti, Francesco, Biscarini, FabioVolume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3534007
File:
PDF, 710 KB
english, 2011