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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Design and analysis of anchorless shuttle nano-electro-mechanical non-volatile memory for high temperature applications
Vaddi, Ramesh, Kim, Tony T., Pott, Vincent, Lin, Julius Tsai MingYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241917
File:
PDF, 935 KB
english, 2012