New Insights Into Recovery Characteristics During PMOS NBTI...

IEEE Transactions on Device and Materials Reliability 2007 / 03 Vol. 7; Iss. 1

New Insights Into Recovery Characteristics During PMOS NBTI and CHC Degradation

Parthasarathy, Chittoor R., Denais, M., Huard, Vincent, Ribes, Guillaume, Vincent, Emmanuel, Bravaix, Alain
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Volume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.898085
Date:
March, 2007
File:
PDF, 819 KB
english, 2007
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