[IEEE International Electron Devices Meeting 1999....

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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers

Peek, H.L., Verbugt, W.E., Heijns, H.
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Year:
1999
Language:
english
DOI:
10.1109/iedm.1999.824287
File:
PDF, 538 KB
english, 1999
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