Imaging of dislocations using backscattered electrons in a scanning electron microscope
Czernuszka, J. T., Long, N. J., Boyes, E. D., Hirsch, P. B.Volume:
62
Language:
english
Journal:
Philosophical Magazine Letters
DOI:
10.1080/09500839008215127
Date:
October, 1990
File:
PDF, 1.30 MB
english, 1990