Strain determination in ultrathin bcc Fe layers on Si(001)...

Physical Review B 2002 / 4 Vol. 65; Iss. 15

Strain determination in ultrathin bcc Fe layers on Si(001) by x-ray diffraction

Bertoncini, P., Wetzel, P., Berling, D., Mehdaoui, A., Loegel, B., Peruchetti, J. C., Gewinner, G., Pierron-Bohnes, V., Bérar, J. F., Renevier, H.
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Volume:
65
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.65.155425
Date:
April, 2002
File:
PDF, 175 KB
english, 2002
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