[IEEE 2012 70th Annual Device Research Conference (DRC) -...

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[IEEE 2012 70th Annual Device Research Conference (DRC) - University Park, PA, USA (2012.06.18-2012.06.20)] 70th Device Research Conference - Experimental demonstration of “Cold” low contact resistivity ohmic contacts on moderately doped n-Ge with in-situ atomic hydrogen clean

Agrawal, Ashish, Park, Jeongwon, Mohata, Dheeraj, Ahmed, Khaled, Datta, Suman
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Year:
2012
Language:
english
DOI:
10.1109/drc.2012.6256959
File:
PDF, 1.23 MB
english, 2012
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