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[IEEE 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (7-9 Feb. 1995)] Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Effect on observed package thermal performance of system board metal content
Billings, D., Stout, R.P.Year:
1995
Language:
english
DOI:
10.1109/stherm.1995.512048
File:
PDF, 607 KB
english, 1995