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[IEEE 2008 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2008.04.22-2008.04.24)] 2008 IEEE International Vacuum Electronics Conference - Development and application of particle emission algorithms from cut-cell boundaries in the VORPAL EM-FDTD-PIC simulation tool
Smithe, David, Stoltz, Peter, Loverich, John, Nieter, Chet, Veitzer, SethYear:
2008
Language:
english
DOI:
10.1109/ivelec.2008.4556513
File:
PDF, 644 KB
english, 2008