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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Random telegraph noise reduction in metal gate high-κ stacks by bipolar switching and the performance boosting technique
Liu, W.H., Pey, K. L., Raghavan, N., Wu, X., Bosman, M., Kauerauf, T.Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784474
File:
PDF, 585 KB
english, 2011