Localization length and impurity dielectric susceptibility...

Localization length and impurity dielectric susceptibility in the critical regime of the metal-insulator transition in homogeneously doped p -type Ge

Watanabe, Michio, Itoh, Kohei M., Ootuka, Youiti, Haller, Eugene E.
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Volume:
62
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.62.R2255
Date:
July, 2000
File:
PDF, 68 KB
english, 2000
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