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[IEEE 1995 53rd Annual Device Research Conference Digest - Charlottesville, VA, USA (19-21 June 1995)] 1995 53rd Annual Device Research Conference Digest - Finite element stress modeling of InGaAsP/InP lasers
Mishkevich, V., Jordan, A.S., Swaminathan, V., Geary, J.M.Year:
1995
Language:
english
DOI:
10.1109/drc.1995.496307
File:
PDF, 149 KB
english, 1995