Dynamic and static structure factor of electrons in Si:...

Physical Review B 1995 / 10 Vol. 52; Iss. 16

Dynamic and static structure factor of electrons in Si: Inelastic x-ray scattering results

Schülke, W., Schmitz, J. R., Schulte-Schrepping, H., Kaprolat, A.
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Volume:
52
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.52.11721
Date:
October, 1995
File:
PDF, 579 KB
english, 1995
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