![](/img/cover-not-exists.png)
[IEEE IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society - Orlando, FL (2008.11.10-2008.11.13)] 2008 34th Annual Conference of IEEE Industrial Electronics - Modeling of faults in operational amplifier circuits using bond graph
Peraza M., C., Diaz, J.G., Arteaga, F., Villanueva, C., Gonzalez-Longatt, F.Year:
2008
Language:
english
DOI:
10.1109/iecon.2008.4757963
File:
PDF, 370 KB
english, 2008