[IEEE IECON 2008 - 34th Annual Conference of IEEE...

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[IEEE IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics Society - Orlando, FL (2008.11.10-2008.11.13)] 2008 34th Annual Conference of IEEE Industrial Electronics - Modeling of faults in operational amplifier circuits using bond graph

Peraza M., C., Diaz, J.G., Arteaga, F., Villanueva, C., Gonzalez-Longatt, F.
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Year:
2008
Language:
english
DOI:
10.1109/iecon.2008.4757963
File:
PDF, 370 KB
english, 2008
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