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Measurements of surface impedance, London penetration depth, and coherence length in Y-Ba-Cu-O films at microwave frequencies
Jiang, H., Yuan, T., How, H., Widom, A., Vittoria, C., Chrisey, D., Horwitz, J., Drehman, A.Volume:
49
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.49.9924
Date:
April, 1994
File:
PDF, 470 KB
english, 1994