Electron-Beam Detection of Bits Reversibly Recorded on...

Japanese Journal of Applied Physics 2006 / 4 Vol. 45; Iss. 4A

Electron-Beam Detection of Bits Reversibly Recorded on Epitaxial InSe/GaSe/Si Phase-Change Diodes

Chaiken, Alison, Gibson, Gary A., Chen, John, Yeh, Bao S., Jasinski, J. B., Liliental-Weber, Z., Nauka, K., Yang, C. C., Lindig, D. D., Subramanian, S.
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Volume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.2580
Date:
April, 2006
File:
PDF, 369 KB
english, 2006
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