Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2010 Vol. 28; Iss. 4
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Polarized emission from GaN/AlN quantum dots subject to uniaxial thermal interfacial stresses
Moshe, O., Rich, D. H., Damilano, B., Massies, J.Volume:
28
Year:
2010
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3435325
File:
PDF, 1.42 MB
english, 2010