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FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System
Crouch, Alfred L., Potter, John C., Khoche, Ajay, Dworak, JenniferVolume:
30
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/MDAT.2013.2278531
Date:
October, 2013
File:
PDF, 876 KB
english, 2013