Electron capture behaviors of deep level traps in unintentionally doped and intentionally doped n-type GaN
Cho, H. K., Kim, C. S., Hong, C.-H.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586981
File:
PDF, 310 KB
english, 2003