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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - A reliability growth model for object oriented software developed under concurrent distributed development environment
Singh, V.B., Khatri, Sujata, Kapur, P.K.Year:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779597
File:
PDF, 1.29 MB
english, 2010