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Surface analysis of ultraprecise polished chemical vapor deposited diamond films using spectroscopic and microscopic techniques
Weima, J. A., Job, R., Fahrner, W. R., Kosaca, G. C., Müller, N., Fries, T.Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1342199
File:
PDF, 965 KB
english, 2001