[IEEE 2010 IEEE International Symposium on Industrial Electronics (ISIE 2010) - Bari, Italy (2010.07.4-2010.07.7)] 2010 IEEE International Symposium on Industrial Electronics - Bivariate EMD analysis for aircraft component inspection
Leo, Marco, D'Orazio, Tiziana, Looney, David, Mandic, Danilo P.Year:
2010
Language:
english
DOI:
10.1109/isie.2010.5636877
File:
PDF, 500 KB
english, 2010