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Improvement of the Reliability of Dielectrics for MLCC
Nakamura, Tomoyuki, Yao, Takayuki, Ikeda, Jun, Kubodera, Noriyuki, Takagi, HiroshiVolume:
18
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/18/9/092007
Date:
October, 2011
File:
PDF, 758 KB
english, 2011