Structural and charge trapping properties of two bilayer...

Applied Physics Letters 2010 Vol. 97; Iss. 16

Structural and charge trapping properties of two bilayer (Ge+SiO[sub 2])/SiO[sub 2] films deposited on rippled substrate

Buljan, M., Grenzer, J., Holý, V., Radić, N., Mišić-Radić, T., Levichev, S., Bernstorff, S., Pivac, B., Capan, I.
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Volume:
97
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3504249
File:
PDF, 721 KB
english, 2010
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