Mechanisms for total dose sensitivity to preirradiation...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits

Pease, R.L., Shaneyfelt, M., Winokur, P., Fleetwood, D., Gorelick, J., McClure, S., Clark, S., Cohns, L., Alexander, D.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685218
Date:
June, 1998
File:
PDF, 686 KB
english, 1998
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