![](/img/cover-not-exists.png)
[IEEE 2008 15th IEEE International Conference on Image Processing - San Diego, CA, USA (2008.10.12-2008.10.15)] 2008 15th IEEE International Conference on Image Processing - Recursive risk estimation for non-linear image deconvolution with a wavelet-domain sparsity constraint
Vonesch, Cedric, Ramani, Sathish, Unser, MichaelYear:
2008
Language:
english
DOI:
10.1109/icip.2008.4711842
File:
PDF, 205 KB
english, 2008