Residual strains in cubic silicon carbide measured by Raman spectroscopy correlated with x-ray diffraction and transmission electron microscopy
Capano, M. A., Kim, B. C., Smith, A. R., Kvam, E. P., Tsoi, S., Ramdas, A. K.Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2357842
File:
PDF, 364 KB
english, 2006