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Individual classification of buried transistors in live microprocessors by functional infrared emission spectral microscopy
Oblefias, Wilma, Soriano, Maricor, Tarun, Alvarado, Saloma, CaesarVolume:
89
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2358935
File:
PDF, 432 KB
english, 2006