Quantity measured in frequency-shift-mode atomic-force...

Quantity measured in frequency-shift-mode atomic-force microscopy: An analysis with a numerical model

Ke, S. H., Uda, T., Terakura, K.
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Volume:
59
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.59.13267
Date:
May, 1999
File:
PDF, 196 KB
english, 1999
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