![](/img/cover-not-exists.png)
Quantity measured in frequency-shift-mode atomic-force microscopy: An analysis with a numerical model
Ke, S. H., Uda, T., Terakura, K.Volume:
59
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.59.13267
Date:
May, 1999
File:
PDF, 196 KB
english, 1999