![](/img/cover-not-exists.png)
Drift and Hysteresis Effects on AlN/SiO 2 Gate pH Ion-Sensitive Field-Effect Transistor
Chiang, Jung-Lung, Chou, Jung-Chuan, Chen, Ying-Chung, Liau, Guo Shiang, Cheng, Chien-ChuanVolume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.4973
Date:
August, 2003
File:
PDF, 129 KB
english, 2003