Experimental evaluation of the forming process of virgin HfO 2 memory cells by capacitance-voltage measurements
Khaldi, O., Jomni, F., Gonon, P., Vallée, C., Mannequin, C., Yangui, B.Volume:
8
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201409153
Date:
July, 2014
File:
PDF, 576 KB
english, 2014