Standard sample probes for characterizing optical apertures...

Review of Scientific Instruments 2003 Vol. 74; Iss. 4

Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy

Imhof, Joseph M., Kwak, Eun-Soo, Vanden Bout, David A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
74
Year:
2003
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1556951
File:
PDF, 562 KB
english, 2003
Conversion to is in progress
Conversion to is failed